Total reflection X-ray fluorescence (TXRF) is an advanced spectroscopic method for multi-element detection at trace and ultra-trace levels. By directing a monochromatic X-ray beam at a sample ...
The DeltaVision OMX V4 enables Total Internal Reflection Fluorescence Microscopy (TIRF). This technique uses an evanescent wave to selectively excite fluorophores that are close to the coverslip. This ...
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