My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

The Sarnoff Digital Test Pattern When I was approached about evaluating the Sarnoff Digital Test Pattern, my interest was piqued immediately. After all, it's been a long time since most of us have ...