LTX-Credence addresses semiconductor test in a variety of areas, including microcontroller, power-management, ASIC, ASSP, data-converter, and RF test. To do that, it deploys a variety of platforms, ...
The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...
This article appeared in Microwaves & RF and has been published here with permission. It’s not uncommon to want to measure the Q factor of a resonator. One may need to determine its suitability for ...
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