Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

Microscopic imaging serves as a crucial method for assessing the quality of selective laser melting (SLM). Traditional approaches rely on manual inspection, which limits their efficiency and ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

A research team led by Tao Sun, associate professor of materials science and engineering at the University of Virginia, has made new discoveries that can expand additive manufacturing in aerospace and ...

The concept of zero defect manufacturing has been around for decades, arising first in the aerospace and defense industry. Since then, this manufacturing approach has been adopted by the automotive ...

Regulating manufacturing processes in the medical device industry is challenging. But process signature verification can help manufacturers get a handle on problems before they get out of control.

This study investigates how manufacturing defects transform the statistical distribution of failure in carbon fiber-reinforced polymer composites under tension and compression loading. The analysis of ...

As device geometries continue to shrink and process integration becomes more complex, the margin for contamination grows smaller with every technology node. Contamination can originate from process ...

Adopting a Quality by Design (QbD) approach for wet granulation requires manufacturers to comprehend the correlation between process variables, such as powder characteristics and equipment ...

Process development is the exercise of creating new and improved manufacturing methods, optimizing them in terms of time and financial efficiency while maintaining regulatory compliance and product ...

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...

In this article, the most common errors occurring at different stages of the semiconductor fabrication process and the strategies to mitigate them are discussed. The ever-growing complexity of the ...