Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, today announced the commercial launch of the Park FX40 IR, completing the company's ...

The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...

Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...